Overlay mark and method of measuring the same

ABSTRACT

A device having an overlay mark over a substrate and a method of adjusting multi-layer overlay alignment using the overlay mark for accuracy are disclosed. The overlay mark includes a first feature in a first layer, having a plurality of first alignment segments substantially parallel to each other extending only along an X direction; a second feature in a second layer over the first layer, having a plurality of second alignment segments substantially parallel to each other extending along a Y direction different from the X direction; and a third feature in a third layer over the second layer, having a plurality of third alignment segments substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments substantially parallel to each other extending along the Y direction.

BACKGROUND

The semiconductor integrated circuit (IC) industry has experienced rapid growth. Technological advances in IC materials and design have produced generations of ICs where each generation has smaller and more complex circuits than the previous generation. Nowadays, the semiconductor devices and integrated circuits include multi-layer structures having dimensions smaller than one micrometer. As known in the art, a photolithography process is a step that determines the critical dimension (CD) in the manufacture of a semiconductor integrated circuit device. Electric circuit patterns are formed by first transferring the pattern on a photo mask to a photoresist layer in a photolithography process, and then transferring the pattern from the photoresist layer to an underlying material layer such as a dielectric layer or a metal layer in a subsequent etching process.

In addition to the control of CD, a successful photolithography process on a wafer includes alignment accuracy (AA). As the scaling down continues especially below 20 nm, aligning multiple layers accurately has become more and more difficult. Therefore, the measurement of accuracy, i.e., the measurement of overlay error, is crucial to the semiconductor fabrication process. An overlay mark is used as a tool for measuring overlay error and to determine whether the photoresist pattern is precisely aligned with the previous layer on a wafer after a photolithography process.

If all or part of the mask is not aligned properly, the resulting features may not align correctly with adjoining layers. This may result in reduced device performance or complete device failure. While existing overlay marks have been used to prevent this, they have not been entirely satisfactory for small dimensional devices.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the following detailed description when read with the accompanying figures. It is emphasized that, in accordance with the standard practice in the industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion.

FIG. 1 is a top view of a wafer that illustrates positions of overlay marks according to various aspects of the present disclosure.

FIG. 2 is a top view of the enlargement of a dotted region in FIG. 1.

FIG. 3 is a top view of an overlay mark for aligning different layers over a substrate according to various aspects of the present disclosure.

FIG. 4A is a cross-sectional view taken along a cutting line A-A′ of FIG. 3.

FIG. 4B is a cross-sectional view taken along a cutting line B-B′ of FIG. 3.

FIG. 5 is a top view of an overlay mark for aligning different layers over a substrate according to various aspects of the present disclosure.

FIG. 6A is a cross-sectional view taken along a cutting line C-C′ of FIG. 5.

FIG. 6B is a cross-sectional view taken along a cutting line D-D′ of FIG. 5.

FIG. 6C is a cross-sectional view taken along a cutting line E-E′ of FIG. 5.

FIG. 6D is a cross-sectional view taken along a cutting line F-F′ of FIG. 5.

FIG. 7 is a top view of an overlay mark for aligning different layers over a substrate according to various aspects of the present disclosure.

FIG. 8A is a cross-sectional view taken along a cutting line G-G′ of FIG. 7.

FIG. 8B is a cross-sectional view taken along a cutting line H-H′ of FIG. 7.

FIG. 9 is a top view of an overlay mark for aligning different layers over a substrate according to various aspects of the present disclosure.

FIG. 10A is a cross-sectional view taken along a cutting line K-K′ of FIG. 9.

FIG. 10B is a cross-sectional view taken along a cutting line L-L′ of FIG. 9.

FIG. 11 is a flowchart of a method of adjusting multi-layer overlay alignment according to various aspects of the present disclosure.

FIG. 12A is a cross-sectional view taken along a cutting line A-A′ of FIG. 3, including two centerlines Y1 and Y2.

FIG. 12B is a cross-sectional view taken along a cutting line B-B′ of FIG. 3, including two centerlines X1 and X2.

FIG. 13A is a signal waveform measured from the overlay mark in FIG. 12A.

FIG. 13B is a signal waveform measured from the overlay mark in FIG. 12B.

FIG. 14A shows the detail of sub-steps 412 a, 412 b, and 412 c of step 412 in FIG. 11.

FIG. 14B shows the detail of sub-steps 408 a, 408 b, and 408 c of step 408 in FIG. 11.

FIG. 15A is a cross-sectional view taken along a cutting line C-C′ of FIG. 5, including a centerline Y2.

FIG. 15B is a cross-sectional view taken along a cutting line D-D′ of FIG. 5, including a centerline X2.

FIG. 15C is a cross-sectional view taken along a cutting line E-E′ of FIG. 5, including a centerline Y1.

FIG. 15D is a cross-sectional view taken along a cutting line F-F′ of FIG. 5, including a centerline X1.

FIG. 16A is a signal waveform measured from the overlay mark in FIG. 15A.

FIG. 16B is a signal waveform measured from the overlay mark in FIG. 15B.

FIG. 16C is a signal waveform measured from the overlay mark in FIG. 15C.

FIG. 16D is a signal waveform measured from the overlay mark in FIG. 15D.

FIG. 17A is a cross-sectional view taken along a cutting line G-G′ of FIG. 7, including an intensity I of an incident light and intensities I₃ and I₄ of a first order diffraction.

FIG. 17B is a cross-sectional view taken along a cutting line H-H′ of FIG. 7, including an intensity I of an incident light and intensities I₁ and I₂ of a first order diffraction.

FIG. 18A shows the detail of sub-steps 412 d, 412 e, and 412 f of step 412 in FIG. 11.

FIG. 18B shows the detail of sub-steps 408 d, 408 e, and 408 f of step 408 in FIG. 11.

DETAILED DESCRIPTION

The present disclosure relates in general to an overlay mark for checking alignment accuracy, and more particularly, to an overlay mark for aligning different layers on a substrate and to a method for adjusting multi-layer overlay alignment.

It is understood that the following disclosure provides many different embodiments, or examples, for implementing different features of various embodiments. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting. For example, the formation of a first feature over or on a second feature in the description that follows may include embodiments in which the first and second features are formed in direct contact, and may also include embodiments in which additional features may be formed between the first and second features, such that the first and second features may not be in direct contact. In addition, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,” “above,” “upper” and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as being “below” or “beneath” other elements or features would then be oriented “above” the other elements or features. Thus, the exemplary term “below” can encompass both an orientation of above and below. The apparatus may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein may likewise be interpreted accordingly.

FIG. 1 is a top view of a wafer 20 that illustrates positions of overlay marks according to various aspects of the present disclosure. FIG. 2 is a top view of the enlargement of a dotted region in FIG. 1. As shown in FIGS. 1 and 2, the wafer 20 is sawed along scribe lines 60 into a plurality of chips or dies 40. Normally, the overlay marks 80 are located on the scribe lines 60 at four corners of an edge of each chip 40 or located inside each chip 40 to measure whether the present layer, such as an opening of a photoresist layer, is precisely aligned with a pre-layer in the fabrication process.

While measuring an overlay error using an overlay mark according to prior approaches, an X-directional deviation is measured along a straight line in an X direction of the overlay mark. A Y-directional deviation is further measured along a straight line in a Y direction of the overlay mark. One single overlay mark can only be used to measure one X- and one Y-directional deviation between two layers on a substrate. When all the overlay marks are measured using this method, whether the present layer and the pre-layer are precisely aligned can be calculated according to the X- and Y-directional deviations.

To check alignment accuracy between three layers, the prior approach used two separate overlay marks on the substrate. According to the prior approach, one overlay mark is used for checking alignment accuracy between the first pre-layer and the present layer, and the other overlay mark is used for checking alignment accuracy between the second pre-layer and the present layer. The area cost is very high for two overlay marks positioned on different areas of the substrate. As the design rule shrinks and the fabrication of the integrated circuits tends to use multi-layer design, the area cost issue of the overlay marks becomes seriously high. Additionally, for checking the alignment accuracy between the first pre-layer and the present layer, the Y-directional deviation may be more concerned than the X-directional deviation. For checking the alignment accuracy between the second pre-layer and the present layer, the X-directional deviation may be more concerned than the Y-directional deviation. However, the method for measuring the overlay error according to the prior approach would collect all the X-directional deviations and Y-directional deviations between the first pre-layer and the present layer, and those between the second pre-layer and the present layer. It would be time-consuming to collect and analyze some data which are not so concerned.

FIG. 3 is a top view of an overlay mark 100 for aligning different layers over a substrate 160 according to various aspects of the present disclosure. As shown in FIG. 3, a device (not shown) comprises the overlay mark 100 over the substrate 160. The device may include various devices or elements, such as semiconductor devices, bipolar junction transistors, resistors, capacitors, diodes, fuses, etc., but is simplified for a better understanding of the concepts of the present disclosure. The substrate 160 may typically be a silicon substrate. The substrate 160 may include various doping configurations depending on design requirements as known in the art. The substrate 160 may also include other elementary semiconductors such as germanium and diamond. Alternatively, the substrate 160 may include a compound semiconductor and/or an alloy semiconductor. Further, the substrate 160 may optionally include an epitaxial layer (epi layer), may be strained for performance enhancement, may include a silicon-on-insulator (SOI) structure, and/or have other suitable enhancement elements. The overlay mark 100 comprises various features over the substrate 160, such as a first feature 130, a second feature 140, and a third feature 120. The first feature 130 represents the pattern of a first pre-layer (hereinafter, a first layer 170), the second feature 140 represents the pattern of a second pre-layer (hereinafter, a second layer 180), and the third feature 120 represents the pattern of the present layer (hereinafter, a third layer 190), such as an opening of a mask 110.

FIG. 4A is a cross-sectional view taken along a cutting line A-A′ of FIG. 3. As shown in FIGS. 3 and 4A, the first feature 130 is disposed in a first layer 170 over the substrate 160, and the first feature 130 extends only along a first longitudinal direction. The first feature 130 comprises a plurality of alignment segments 130 a, 130 b substantially parallel to each other. The first feature 130 may comprise an isolation structure such as a shallow trench isolation (STI), a field oxide (FOX), a local-oxidation of silicon (LOCOS) feature, and/or other suitable isolation element. The isolation structure may comprise a dielectric material such as silicon oxide, silicon nitride, silicon oxy-nitride, fluoride-doped silicate (FSG), a low-k dielectric material, combinations thereof, and/or other suitable material. In some embodiments, the first longitudinal direction is an X direction.

FIG. 4B is a cross-sectional view taken along a cutting line B-B′ of FIG. 3. As shown in FIGS. 3 and 4B, the second feature 140 is disposed in a second layer 180 over the first layer 170, and the second feature 140 extends along a second longitudinal direction different from the first longitudinal direction. The second feature 140 comprises a plurality of alignment segments 140 a, 140 b substantially parallel to each other. The second feature 140 may comprise a gate electrode. The gate electrode may be sacrificial, for example, such as formed in a replacement gate process. In some embodiments, the gate electrode includes polysilicon. The polysilicon may be formed by suitable deposition processes such as, for example, low-pressure chemical vapor deposition (LPCVD) and plasma-enhanced CVD (PECVD). In some embodiments, the gate electrode includes conductive material such as metal. In some embodiments, the second longitudinal direction is a Y direction substantially perpendicular to the X direction.

As depicted in FIGS. 3, 4A, and 4B, the third feature 120 is disposed in a third layer 190 over the second layer 180, and the third feature 120 extends along both the first longitudinal direction and the second longitudinal direction. The third feature 120 comprises a plurality of alignment segments 120 a, 120 b substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments 120 c, 120 d substantially parallel to each other extending along the second longitudinal direction. The third feature 120 may comprise a continuous opening or a plurality of openings 120 a-120 d in a mask 110. The mask 110 may comprise a positive-tone or negative-tone photoresist such as polymer, or a hard mask such as silicon nitride or silicon oxy-nitride. The third layer 190 may be patterned using suitable photolithography processes such as, for example, forming a photoresist layer, exposing the photoresist layer to a pattern, baking and developing the photoresist to form the mask 110. The mask 110 may then be used to etch a pattern (e.g., a contact) into a dielectric layer 150 such as silicon oxide disposed below the mask 110. In some embodiments, the third feature 120 comprises four alignment segments 120 a-120 d forming a rectangular pattern or a square pattern. In some embodiments, the first longitudinal direction is substantially perpendicular to the second longitudinal direction. In some embodiments, the first longitudinal direction is the X direction and the second longitudinal direction is the Y direction substantially perpendicular to the X direction.

FIG. 5 is a top view of an overlay mark 200 for aligning different layers over a substrate 260 according to various aspects of the present disclosure. As shown in FIG. 5, a device (not shown) comprises the overlay mark 200 over the substrate 260. The device may include various devices or elements, such as semiconductor devices, bipolar junction transistors, resistors, capacitors, diodes, fuses, etc., but is simplified for a better understanding of the concepts of the present disclosure. The substrate 260 may typically be a silicon substrate. The substrate 260 may include various doping configurations depending on design requirements as known in the art. The substrate 260 may also include other elementary semiconductors such as germanium and diamond. Alternatively, the substrate 260 may include a compound semiconductor and/or an alloy semiconductor. Further, the substrate 260 may optionally include an epitaxial layer (epi layer), may be strained for performance enhancement, may include a silicon-on-insulator (SOI) structure, and/or have other suitable enhancement elements. The overlay mark 200 comprises various features over the substrate 260, such as a first feature 230, a second feature 240, and a third feature 220. The first feature 230 represents the pattern of a first pre-layer (hereinafter, a first layer 270), the second feature 240 represents the pattern of a second pre-layer (hereinafter, a second layer 280), and the third feature 220 represents the pattern of the present layer (hereinafter, a third layer 290), such as an opening of a mask 210.

FIG. 6A is a cross-sectional view taken along a cutting line C-C′ of FIG. 5. Please note that the cross-sectional view in FIG. 6A shows only the dashed portions of the cutting line C-C′ in FIG. 5 while the dotted portion is not shown. In other words, the cross-sectional views of the dashed portions of the cutting line C-C′ are linked together in FIG. 6A. As shown in FIGS. 5 and 6A, the first feature 230 is disposed in a first layer 270 over the substrate 260, and the first feature 230 extends only along a first longitudinal direction. The first feature 230 comprises a plurality of alignment segments 230 a-230 t substantially parallel to each other. The first feature 230 may comprise an isolation structure such as a shallow trench isolation (STI), a field oxide (FOX), a local-oxidation of silicon (LOCOS) feature, and/or other suitable isolation element. The isolation structure may comprise a dielectric material such as silicon oxide, silicon nitride, silicon oxy-nitride, fluoride-doped silicate (FSG), a low-k dielectric material, combinations thereof, and/or other suitable material. In some embodiments, the first longitudinal direction is an X direction.

FIG. 6B is a cross-sectional view taken along a cutting line D-D′ of FIG. 5. Similarly, the cross-sectional view in FIG. 6B shows only the dashed portions of the cutting line D-D′ in FIG. 5 while the dotted portion is not shown. As shown in FIGS. 5 and 6B, the second feature 240 is disposed in a second layer 280 over the first layer 270, and the second feature 240 extends along a second longitudinal direction different from the first longitudinal direction. The second feature 240 comprises a plurality of alignment segments 240 a-240 t substantially parallel to each other. The second feature 240 may comprise a gate electrode. The gate electrode may be sacrificial, for example, such as formed in a replacement gate process. In some embodiments, the gate electrode includes polysilicon. The polysilicon may be formed by suitable deposition processes such as, for example, low-pressure chemical vapor deposition (LPCVD) and plasma-enhanced CVD (PECVD). In some embodiments, the gate electrode includes conductive material such as metal. In some embodiments, the second longitudinal direction is a Y direction substantially perpendicular to the X direction.

FIG. 6C is a cross-sectional view taken along a cutting line E-E′ of FIG. 5. The cross-sectional view in FIG. 6C shows only the dashed portions of the cutting line E-E′ in FIG. 5 while the dotted portion is not shown. FIG. 6D is a cross-sectional view taken along a cutting line F-F′ of FIG. 5. The cross-sectional view in FIG. 6D shows only the dashed portions of the cutting line F-F′ in FIG. 5 while the dotted portion is not shown. As shown in FIGS. 5, 6C, and 6D, the third feature 220 is disposed in a third layer 290 over the second layer 280, and the third feature 220 extends along both the first longitudinal direction and the second longitudinal direction. The third feature 220 comprises a plurality of alignment segments 220 a-220 t substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments 220 a′-220 t′ substantially parallel to each other extending along the second longitudinal direction. The third feature 220 may comprise a plurality of openings 220 a-220 t and 220 a′-220 t′ in a mask 210. The mask 210 may comprise a positive-tone or negative-tone photoresist such as polymer, or a hard mask such as silicon nitride or silicon oxy-nitride. The third layer 290 may be patterned using suitable photolithography processes such as, for example, forming a photoresist layer, exposing the photoresist layer to a pattern, baking and developing the photoresist to form the mask 210. The mask 210 may then be used to etch a pattern (e.g., a contact) into a dielectric layer 250 such as silicon oxide disposed below the mask 210. In some embodiments, the first longitudinal direction is substantially perpendicular to the second longitudinal direction. In some embodiments, the first longitudinal direction is the X direction and the second longitudinal direction is the Y direction substantially perpendicular to the X direction.

FIG. 7 is a top view of an overlay mark 300 for aligning different layers over a substrate 360 according to various aspects of the present disclosure. As shown in FIG. 7, a device (not shown) comprises the overlay mark 300 over the substrate 360. The device may include various devices or elements, such as semiconductor devices, bipolar junction transistors, resistors, capacitors, diodes, fuses, etc., but is simplified for a better understanding of the concepts of the present disclosure. The substrate 360 may typically be a silicon substrate. The substrate 360 may include various doping configurations depending on design requirements as known in the art. The substrate 360 may also include other elementary semiconductors such as germanium and diamond. Alternatively, the substrate 360 may include a compound semiconductor and/or an alloy semiconductor. Further, the substrate 360 may optionally include an epitaxial layer (epi layer), may be strained for performance enhancement, may include a silicon-on-insulator (SOI) structure, and/or have other suitable enhancement elements. The overlay mark 300 comprises various features over the substrate 360, such as a first feature 330, a second feature 340, and a third feature 320. The first feature 330 represents the pattern of a first pre-layer (hereinafter, a first layer 370), the second feature 340 represents the pattern of a second pre-layer (hereinafter, a second layer 380), and the third feature 320 represents the pattern of the present layer (hereinafter, a third layer 390), such as an opening of a mask 310.

FIG. 8A is a cross-sectional view taken along a cutting line G-G′ of FIG. 7. The cross-sectional view in FIG. 8A shows only the dashed portions of the cutting line G-G′ in FIG. 7 while the dotted portion is not shown. As shown in FIGS. 7 and 8A, the first feature 330 is disposed in a first layer 370 over the substrate 360, and the first feature 330 extends only along a first longitudinal direction. The first feature 330 comprises a plurality of alignment segments 330 a-330 j substantially parallel to each other. The first feature 330 may comprise an isolation structure such as a shallow trench isolation (STI), a field oxide (FOX), a local-oxidation of silicon (LOCOS) feature, and/or other suitable isolation element. The isolation structure may comprise a dielectric material such as silicon oxide, silicon nitride, silicon oxy-nitride, fluoride-doped silicate (FSG), a low-k dielectric material, combinations thereof, and/or other suitable material. In some embodiments, the first longitudinal direction is an X direction.

FIG. 8B is a cross-sectional view taken along a cutting line H-H′ of FIG. 7. The cross-sectional view in FIG. 8B shows only the dashed portions of the cutting line H-H′ in FIG. 7 while the dotted portion is not shown. As shown in FIGS. 7 and 8B, the second feature 340 is disposed in a second layer 380 over the first layer 370, and the second feature 340 extends along a second longitudinal direction different from the first longitudinal direction. The second feature 340 comprises a plurality of alignment segments 340 a-340 j substantially parallel to each other. The second feature 340 may comprise a gate electrode. The gate electrode may be sacrificial, for example, such as formed in a replacement gate process. In some embodiments, the gate electrode includes polysilicon. The polysilicon may be formed by suitable deposition processes such as, for example, low-pressure chemical vapor deposition (LPCVD) and plasma-enhanced CVD (PECVD). In some embodiments, the gate electrode includes conductive material such as metal. In some embodiments, the second longitudinal direction is a Y direction substantially perpendicular to the X direction.

As depicted in FIGS. 7, 8A, and 8B, the third feature 320 is disposed in a third layer 390 over the second layer 380, and the third feature 320 extends along both the first longitudinal direction and the second longitudinal direction. The third feature 320 comprises a plurality of alignment segments 320 a-320 j substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments 320 a′-320 j′ substantially parallel to each other extending along the second longitudinal direction. The third feature 320 may comprise a plurality of openings 320 a-320 j and 320 a′-320 j′ in a mask 310. The mask 310 may comprise a positive-tone or negative-tone photoresist such as polymer, or a hard mask such as silicon nitride or silicon oxy-nitride. The third layer 390 may be patterned using suitable photolithography processes such as, for example, forming a photoresist layer, exposing the photoresist layer to a pattern, baking and developing the photoresist to form the mask 310. The mask 310 may then be used to etch a pattern (e.g., a contact) into a dielectric layer 350 such as silicon oxide disposed below the mask 310. In some embodiments, the first longitudinal direction is substantially perpendicular to the second longitudinal direction. In some embodiments, the first longitudinal direction is the X direction and the second longitudinal direction is the Y direction substantially perpendicular to the X direction.

The overlay marks of the present disclosure are not limited to the above-mentioned embodiments, and may have other different embodiments. To simplify the description and for the convenience of comparison between each of the embodiments of the present disclosure, the identical components in each of the following embodiments are marked with identical numerals. For making it easier to compare the difference between the embodiments, the following description will detail the dissimilarities among different embodiments and the identical features will not be redundantly described.

FIG. 9 is a top view of an overlay mark 305 for aligning different layers over a substrate 360 according to various aspects of the present disclosure. FIG. 9 is similar to FIG. 7 except that the shape of the overlay mark 305 is rectangular compared to that of the overlay mark 300 being square. The overlay mark 305 may be located on the scribe lines at the four corners of the edge of each chip to save the area, or located inside each chip. FIG. 10A is a cross-sectional view taken along a cutting line K-K′ of FIG. 9. FIG. 10A is similar to FIG. 8A, and the cross-sectional view in FIG. 10A shows only the dashed portions of the cutting line K-K′ in FIG. 9 while the dotted portion is not shown. FIG. 10B is a cross-sectional view taken along a cutting line L-L′ of FIG. 9. FIG. 10B is similar to FIG. 8B, and the cross-sectional view in FIG. 10B shows only the dashed portions of the cutting line L-L′ in FIG. 9 while the dotted portion is not shown. The detailed description of FIGS. 9, 10A, and 10B for the overlay mark 305 may refer to that of FIGS. 7, 8A, and 8B for the overlay mark 300.

FIG. 11 is a flowchart of a method 400 of adjusting multi-layer overlay alignment according to various aspects of the present disclosure. It is understood that additional steps can be provided before, during, and after the method 400, and some of the steps described can be replaced or eliminated for other embodiments of the method. The method 400 begins at step 402 in which a first feature in a first layer over a substrate is provided, wherein the first feature comprises a plurality of first alignment segments substantially parallel to each other extending only along an X direction. The method 400 continues with step 404 in which a second feature in a second layer over the first layer is provided, wherein the second feature comprises a plurality of second alignment segments substantially parallel to each other extending along a Y direction different from the X direction. The method 400 continues with step 406 in which a third feature in a third layer over the second layer is provided, wherein the third feature comprises a plurality of third alignment segments substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments substantially parallel to each other extending along the Y direction. The method 400 continues with step 408 in which an X-directional deviation between the fourth alignment segments and the second alignment segments is measured. The method 400 continues with step 410 in which an X-directional offset value by the X-directional deviation is calculated. The method 400 continues with step 412 in which a Y-directional deviation between the third alignment segments and the first alignment segments is measured. The method 400 continues with step 414 in which a Y-directional offset value by the Y-directional deviation is calculated. The method 400 continues with step 416 in which the X-directional offset value or the Y-directional offset value is used to compensate for an overlay error. The method 400 may further comprise repeating a photolithography process if the overlay error is larger than an acceptable deviation. The discussion that follows illustrates embodiments of overlay marks that can be measured according to the method 400 of FIG. 11.

As depicted in FIGS. 3 and 4A, and step 402 in FIG. 11, the method 400 begins at step 402 by providing a first feature 130 in a first layer 170 over a substrate 160, wherein the first feature 130 comprises a plurality of first alignment segments 130 a, 130 b substantially parallel to each other extending only along an X direction. The first feature 130 may comprise an isolation structure such as a shallow trench isolation (STI), a field oxide (FOX), a local-oxidation of silicon (LOCOS) feature, and/or other suitable isolation element. The isolation structure may comprise a dielectric material such as silicon oxide, silicon nitride, silicon oxy-nitride, fluoride-doped silicate (FSG), a low-k dielectric material, combinations thereof, and/or other suitable material.

As depicted in FIGS. 3 and 4B, and step 404 in FIG. 11, the method 400 continues with step 404 by providing a second feature 140 in a second layer 180 over the first layer 170, wherein the second feature 140 comprises a plurality of second alignment segments 140 a, 140 b substantially parallel to each other extending along a Y direction different from the X direction. The second feature 140 may comprise a gate electrode. The gate electrode may be sacrificial, for example, such as formed in a replacement gate process. In some embodiments, the gate electrode includes polysilicon. The polysilicon may be formed by suitable deposition processes such as, for example, low-pressure chemical vapor deposition (LPCVD) and plasma-enhanced CVD (PECVD). In some embodiments, the gate electrode includes conductive material such as metal. In some embodiments, the Y direction is substantially perpendicular to the X direction.

As depicted in FIGS. 3, 4A, and 4B, and step 406 in FIG. 11, the method 400 continues with step 406 by providing a third feature 120 in a third layer 190 over the second layer 180, wherein the third feature 120 comprises a plurality of third alignment segments 120 a, 120 b substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments 120 c, 120 d substantially parallel to each other extending along the Y direction. The third feature 120 may comprise a continuous opening or a plurality of openings 120 a-120 d in a mask 110. The mask 110 may comprise a positive-tone or negative-tone photoresist such as polymer, or a hard mask such as silicon nitride or silicon oxy-nitride. The third layer 190 may be patterned using suitable photolithography processes such as, for example, forming a photoresist layer, exposing the photoresist layer to a pattern, baking and developing the photoresist to form the mask 110. The mask 110 may then be used to etch a pattern (e.g., a contact) into a dielectric layer 150 such as silicon oxide disposed below the mask 110. In some embodiments, the third feature 120 comprises four alignment segments 120 a-120 d forming a rectangular pattern or a square pattern. In some embodiments, the X direction is substantially perpendicular to the Y direction.

FIG. 12B is a cross-sectional view taken along a cutting line B-B′ of FIG. 3, including two centerlines X1 and X2. FIG. 13B is a signal waveform measured from the overlay mark 100 in FIG. 12B. As depicted in FIGS. 12B and 13B, and step 408 in FIG. 11, the method 400 continues with step 408 by measuring an X-directional deviation (ΔX) between the fourth alignment segments 120 c, 120 d and the second alignment segments 140 a, 140 b. Peak signals of the second alignment segments 140 a, 140 b in FIG. 12B are denoted as 142 a and 142 b in FIG. 13B, and the peak signals of the fourth alignment segments 120 c, 120 d in FIG. 12B are denoted as 122 c and 122 d in FIG. 13B. Using the overlay mark 100 to measure the alignment accuracy, a first mean value 122′ of the peak signals 122 c and 122 d is obtained. A second mean value 142 of the peak signals 142 a and 142 b is also obtained. A difference between the first mean value 122′ and the second mean value 142 is calculated as the X-directional deviation (ΔX) between the fourth alignment segments 120 c, 120 d and the second alignment segments 140 a, 140 b.

In some embodiments, step 408 may comprise several sub-steps 408 a, 408 b, and 408 c. FIG. 14B shows the detail of sub-steps 408 a-408 c of step 408 in FIG. 11. As depicted in FIGS. 12B and 13B, and sub-steps 408 a-408 c in FIG. 14B, the first mean value 122′ defines the centerline X1 parallel to the fourth alignment segments 120 c, 120 d. The second mean value 142 defines the centerline X2 parallel to the second alignment segments 140 a, 140 b. The difference between the first mean value 122′ and the second mean value 142 is calculated as the X-directional deviation (ΔX) between the centerline X1 and the centerline X2. As depicted in step 410 in FIG. 11, the method 400 continues with step 410 by calculating an X-directional offset value by the X-directional deviation (ΔX). The X-directional offset value is the reverse of the X-directional deviation (ΔX), or any value appropriate for adjusting the X-directional deviation (ΔX).

FIG. 12A is a cross-sectional view taken along a cutting line A-A′ of FIG. 3, including two centerlines Y1 and Y2. FIG. 13A is a signal waveform measured from the overlay mark 100 in FIG. 12A. As depicted in FIGS. 12A and 13A, and step 412 in FIG. 11, the method 400 continues with step 412 by measuring a Y-directional deviation (ΔY) between the third alignment segments 120 a, 120 b and the first alignment segments 130 a, 130 b. The peak signals of the first alignment segments 130 a, 130 b in FIG. 12A are denoted as 132 a and 132 b in FIG. 13A, and the peak signals of the third alignment segments 120 a, 120 b in FIG. 12A are denoted as 122 a and 122 b in FIG. 13A. Using the overlay mark 100 to measure the alignment accuracy, a third mean value 122 of the peak signals 122 a and 122 b is obtained. A fourth mean value 132 of the peak signals 132 a and 132 b is also obtained. A difference between the third mean value 122 and the fourth mean value 132 is calculated as the Y-directional deviation (ΔY) between the third alignment segments 120 a, 120 b and the first alignment segments 130 a, 130 b.

In some embodiments, step 412 may comprise several sub-steps 412 a, 412 b, and 412 c. FIG. 14A shows the detail of sub-steps 412 a-412 c of step 412 in FIG. 11. As depicted in FIGS. 12A and 13A, and sub-steps 412 a-412 c in FIG. 14A, the third mean value 122 defines the centerline Y1 parallel to the third alignment segments 120 a, 120 b. The fourth mean value 132 defines the centerline Y2 parallel to the first alignment segments 130 a, 130 b. The difference between the third mean value 122 and the fourth mean value 132 is calculated as the Y-directional deviation (ΔY) between the centerline Y1 and the centerline Y2. As depicted in step 414 in FIG. 11, the method 400 continues with step 414 by calculating a Y-directional offset value by the Y-directional deviation (ΔY). The Y-directional offset value is the reverse of the Y-directional deviation (ΔY), or any value appropriate for adjusting the Y-directional deviation (ΔY).

As depicted in step 416 in FIG. 11, the method 400 continues with step 416 by using the X-directional offset value and/or the Y-directional offset value to compensate for an overlay error. The overlay error may comprise the X-directional deviation (ΔX), the Y-directional deviation (ΔY), or the combination of both. After the overlay error is compensated, the multi-layer overlay alignment accuracy (AA) is adjusted and will be implemented in next run of the photolithography process. In some embodiments, the method 400 may further comprise repeating a photolithography process if the overlay error is larger than an acceptable deviation. If the overlay error is larger than an acceptable deviation, the alignment between the third feature 120 and the first feature 130, and/or the alignment between the third feature 120 and the second feature 140, do/does not reach the required accuracy. Consequently, the third feature 120 has to be removed, and the photolithography process has to be repeated until the overlay error is no larger than the acceptable deviation.

In various embodiments, the method 400 may be used with the overlay mark 200 of FIGS. 5 and 6A-6D. As depicted in FIGS. 5 and 6A, and step 402 in FIG. 11, the method 400 begins at step 402 by providing a first feature 230 in a first layer 270 over a substrate 260, wherein the first feature 230 comprises a plurality of first alignment segments 230 a-230 t substantially parallel to each other extending only along an X direction. The first feature 230 may comprise an isolation structure such as a shallow trench isolation (STI), a field oxide (FOX), a local-oxidation of silicon (LOCOS) feature, and/or other suitable isolation element. The isolation structure may comprise a dielectric material such as silicon oxide, silicon nitride, silicon oxy-nitride, fluoride-doped silicate (FSG), a low-k dielectric material, combinations thereof, and/or other suitable material.

As depicted in FIGS. 5 and 6B, and step 404 in FIG. 11, the method 400 continues with step 404 by providing a second feature 240 in a second layer 280 over the first layer 270, wherein the second feature 240 comprises a plurality of second alignment segments 240 a-240 t substantially parallel to each other extending along a Y direction different from the X direction. The second feature 240 may comprise a gate electrode. The gate electrode may be sacrificial, for example, such as formed in a replacement gate process. In some embodiments, the gate electrode includes polysilicon. The polysilicon may be formed by suitable deposition processes such as, for example, low-pressure chemical vapor deposition (LPCVD) and plasma-enhanced CVD (PECVD). In some embodiments, the gate electrode includes conductive material such as metal. In some embodiments, the Y direction is substantially perpendicular to the X direction.

As depicted in FIGS. 5, 6C, and 6D, and step 406 in FIG. 11, the method 400 continues with step 406 by providing a third feature 220 in a third layer 290 over the second layer 280, wherein the third feature 220 comprises a plurality of third alignment segments 220 a-220 t substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments 220 a′-220 t′ substantially parallel to each other extending along the Y direction. The third feature 220 may comprise a plurality of openings 220 a-220 t and 220 a′-220 t′ in a mask 210. The mask 210 may comprise a positive-tone or negative-tone photoresist such as polymer, or a hard mask such as silicon nitride or silicon oxy-nitride. The third layer 290 may be patterned using suitable photolithography processes such as, for example, forming a photoresist layer, exposing the photoresist layer to a pattern, baking and developing the photoresist to form the mask 210. The mask 210 may then be used to etch a pattern (e.g., a contact) into a dielectric layer 250 such as silicon oxide disposed below the mask 210. In some embodiments, the X direction is substantially perpendicular to the Y direction.

FIG. 15B is a cross-sectional view taken along a cutting line D-D′ of FIG. 5, including a centerline X2, and FIG. 16B is a signal waveform measured from the overlay mark 200 in FIG. 15B. FIG. 15D is a cross-sectional view taken along a cutting line F-F′ of FIG. 5, including a centerline X1, and FIG. 16D is a signal waveform measured from the overlay mark 200 in FIG. 15D. As depicted in FIGS. 15B, 15D, 16B, and 16D, and step 408 in FIG. 11, the method 400 continues with step 408 by measuring an X-directional deviation (ΔX) between the fourth alignment segments 220 a′-220 t′ and the second alignment segments 240 a-240 t. The peak signals of the second alignment segments 240 a-240 t in FIG. 15B are denoted as 242 a-242 t in FIG. 16B, and the peak signals of the fourth alignment segments 220 a′-220 t′ in FIG. 15D are denoted as 222 a′-222 t′ in FIG. 16D. Using the overlay mark 200 to measure the alignment accuracy, a first mean value 222′ of the peak signals 222 a′-222 t′ is obtained. A second mean value 242 of the peak signals 242 a-242 t is also obtained. A difference between the first mean value 222′ and the second mean value 242 is calculated as the X-directional deviation (ΔX) between the fourth alignment segments 220 a′-220 t′ and the second alignment segments 240 a-240 t.

In some embodiments, step 408 may comprise several sub-steps 408 a, 408 b, and 408 c. FIG. 14B shows the detail of sub-steps 408 a-408 c of step 408 in FIG. 11. As depicted in FIGS. 15B, 15D, 16B, and 16D, and sub-steps 408 a-408 c in FIG. 14B, the first mean value 222′ defines the centerline X1 parallel to the fourth alignment segments 220 a′-220 t′. The second mean value 242 defines the centerline X2 parallel to the second alignment segments 240 a-240 t. The difference between the first mean value 222′ and the second mean value 242 is calculated as the X-directional deviation (ΔX) between the centerline X1 and the centerline X2. As depicted in step 410 in FIG. 11, the method 400 continues with step 410 by calculating an X-directional offset value by the X-directional deviation (ΔX). The X-directional offset value is the reverse of the X-directional deviation (ΔX), or any value appropriate for adjusting the X-directional deviation (ΔX).

FIG. 15A is a cross-sectional view taken along a cutting line C-C′ of FIG. 5, including a centerline Y2, and FIG. 16A is a signal waveform measured from the overlay mark 200 in FIG. 15A. FIG. 15C is a cross-sectional view taken along a cutting line E-E′ of FIG. 5, including a centerline Y1, and FIG. 16C is a signal waveform measured from the overlay mark 200 in FIG. 15C. As depicted in FIGS. 15A, 15C, 16A, and 16C, the method 400 continues with step 412 by measuring a Y-directional deviation (ΔY) between the third alignment segments 220 a-220 t and the first alignment segments 230 a-230 t. The peak signals of the first alignment segments 230 a-230 t in FIG. 15A are denoted as 232 a-232 t in FIG. 16A, and the peak signals of the third alignment segments 220 a-220 t in FIG. 15C are denoted as 222 a-222 t in FIG. 16C. Using the overlay mark 200 to measure the alignment accuracy, a third mean value 222 of the peak signals 222 a-222 t is obtained. A fourth mean value 232 of the peak signals 232 a-232 t is also obtained. A difference between the third mean value 222 and the fourth mean value 232 is calculated as the Y-directional deviation (ΔY) between the third alignment segments 220 a-220 t and the first alignment segments 230 a-230 t.

In some embodiments, step 412 may comprise several sub-steps 412 a, 412 b, and 412 c. FIG. 14A shows the detail of sub-steps 412 a-412 c of step 412 in FIG. 11. As depicted in FIGS. 15A, 15C, 16A, and 16C, and sub-steps 412 a-412 c in FIG. 14A, the third mean value 222 defines the centerline Y1 parallel to the third alignment segments 220 a-220 t. The fourth mean value 232 defines the centerline Y2 parallel to the first alignment segments 230 a-230 t. The difference between the third mean value 222 and the fourth mean value 232 is calculated as the Y-directional deviation (ΔY) between the centerline Y1 and the centerline Y2. As depicted in step 414 in FIG. 11, the method 400 continues with step 414 by calculating a Y-directional offset value by the Y-directional deviation (ΔY). The Y-directional offset value is the reverse of the Y-directional deviation (ΔY), or any value appropriate for adjusting the Y-directional deviation (ΔY).

As depicted in step 416 in FIG. 11, the method 400 continues with step 416 by using the X-directional offset value and/or the Y-directional offset value to compensate for an overlay error. The overlay error may comprise the X-directional deviation (ΔX), the Y-directional deviation (ΔY), or the combination of both. After the overlay error is compensated, the multi-layer overlay alignment accuracy (AA) is adjusted and will be implemented in next run of the photolithography process. In some embodiments, the method 400 may further comprise repeating a photolithography process if the overlay error is larger than an acceptable deviation. If the overlay error is larger than an acceptable deviation, the alignment between the third feature 220 and the first feature 230, and/or the alignment between the third feature 220 and the second feature 240, do/does not reach the required accuracy. Consequently, the third feature 220 has to be removed, and the photolithography process has to be repeated until the overlay error is no larger than the acceptable deviation.

In various embodiments, the method 400 may be used with the overlay mark 300 of FIGS. 7, 8A, and 8B. As depicted in FIGS. 7 and 8A, and step 402 in FIG. 11, the method 400 begins at step 402 by providing a first feature 330 in a first layer 370 over a substrate 360, wherein the first feature 330 comprises a plurality of first alignment segments 330 a-330 j substantially parallel to each other extending only along an X direction. The first feature 330 may comprise an isolation structure such as a shallow trench isolation (STI), a field oxide (FOX), a local-oxidation of silicon (LOCOS) feature, and/or other suitable isolation element. The isolation structure may comprise a dielectric material such as silicon oxide, silicon nitride, silicon oxy-nitride, fluoride-doped silicate (FSG), a low-k dielectric material, combinations thereof, and/or other suitable material.

As depicted in FIGS. 7 and 8B, and step 404 in FIG. 11, the method 400 continues with step 404 by providing a second feature 340 in a second layer 380 over the first layer 370, wherein the second feature 340 comprises a plurality of second alignment segments 340 a-340 j substantially parallel to each other extending along a Y direction different from the X direction. The second feature 340 may comprise a gate electrode. The gate electrode may be sacrificial, for example, such as formed in a replacement gate process. In some embodiments, the gate electrode includes polysilicon. The polysilicon may be formed by suitable deposition processes such as, for example, low-pressure chemical vapor deposition (LPCVD) and plasma-enhanced CVD (PECVD). In some embodiments, the gate electrode includes conductive material such as metal. In some embodiments, the Y direction is substantially perpendicular to the X direction.

As depicted in FIGS. 7, 8A, and 8B, and step 406 in FIG. 11, the method 400 continues with step 406 by providing a third feature 320 in a third layer 390 over the second layer 380, wherein the third feature 320 comprises a plurality of third alignment segments 320 a-320 j substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments 320 a′-320 j′ substantially parallel to each other extending along the Y direction. The third feature 320 may comprise a plurality of openings 320 a-320 j and 320 a′-320 j′ in a mask 310. The mask 310 may comprise a positive-tone or negative-tone photoresist such as polymer, or a hard mask such as silicon nitride or silicon oxy-nitride. The third layer 390 may be patterned using suitable photolithography processes such as, for example, forming a photoresist layer, exposing the photoresist layer to a pattern, baking and developing the photoresist to form the mask 310. The mask 310 may then be used to etch a pattern (e.g., a contact) into a dielectric layer 350 such as silicon oxide disposed below the mask 310. In some embodiments, the X direction is substantially perpendicular to the Y direction.

FIG. 17B is a cross-sectional view taken along a cutting line H-H′ of FIG. 7, including an intensity I of an incident light and intensities I₁ and I₂ of a first order diffraction. As depicted in FIG. 17B and step 408 in FIG. 11, the method 400 continues with step 408 by measuring an X-directional deviation (ΔX) between the fourth alignment segments 320 a′-320 j′ and the second alignment segments 340 a-340 j. The overlay measurement principle used here is based on measuring asymmetry via the detection of first or higher order diffraction. In some embodiments, step 408 may comprise several sub-steps 408 d, 408 e, and 408 f. FIG. 18B shows the detail of sub-steps 408 d-408 f of step 408 in FIG. 11. As depicted in FIG. 17B, and sub-steps 408 d-408 f in FIG. 18B, an intensity I₁ of a positive first order diffraction on gratings of the fourth alignment segments 320 a′-320 j′ and the second alignment segments 340 a-340 j is detected. An intensity I₂ of a negative first order diffraction on gratings of the fourth alignment segments 320 a′-320 j′ and the second alignment segments 340 a-340 j, is also detected. An intensity difference of I₁ and I₂ on gratings of the fourth alignment segments 320 a′-320 j′ and the second alignment segments 340 a-340 j is calculated, wherein the X-directional deviation (ΔX) is proportional to the intensity difference.

If gratings of the fourth alignment segments 320 a′-320 j′ and the second alignment segments 340 a-340 j were on top of each other, forming one grating, the intensity I₁ of the positive first order diffraction and the intensity I₂ of the negative first order diffraction would be the same, then there would be no X-directional deviation (ΔX) between the fourth alignment segments 320 a′-320 j′ and the second alignment segments 340 a-340 j. If there is any misalignment between these two gratings, this will induce an asymmetry A (i.e. the intensity difference) between the intensities of I₁ and I₂, which is proportional to the X-directional deviation (ΔX). This relationship could be expressed as one equation A=I₁-I₂=K*ΔX. In order to determine ΔX, the proportionality factor K needs to be determined first. To solve this problem, gratings are shifted with respect to each other by a distance d. If there was no ΔX, there would be gratings with a relative shift +d yielding an asymmetry A₁=K*d and gratings with a relative shift −d yielding an asymmetry A₂=−K*d. In the presence of ΔX, the relative shifts of gratings amount to ΔX+d and ΔX−d, yielding asymmetries A₁=K*(ΔX+d) and A₂=K*(ΔX−d). With these two equations, one may find ΔX=d*(A₁+A₂)/(A₁-A₂). So the X-directional deviation (ΔX) is obtained. As depicted in step 410 in FIG. 11, the method 400 continues with step 410 by calculating an X-directional offset value by the X-directional deviation (ΔX). The X-directional offset value is the reverse of the X-directional deviation (ΔX), or any value appropriate for adjusting the X-directional deviation (ΔX).

FIG. 17A is a cross-sectional view taken along a cutting line G-G′ of FIG. 7, including an intensity I of an incident light and intensities I3 and I4 of a first order diffraction. As depicted in FIG. 17A and step 412 in FIG. 11, the method 400 continues with step 412 by measuring a Y-directional deviation (ΔY) between the third alignment segments 320 a-320 j and the first alignment segments 330 a-330 j. The overlay measurement principle used here is based on measuring asymmetry via the detection of first or higher order diffraction. In some embodiments, step 412 may comprise several sub-steps 412 d, 412 e, and 412 f. FIG. 18A shows the detail of sub-steps 412 d-412 f of step 412 in FIG. 11. As depicted in FIG. 17A, and sub-steps 412 d-412 f in FIG. 18A, an intensity I₃ of a positive first order diffraction on gratings of the third alignment segments 320 a-320 j and the first alignment segments 330 a-330 j is detected. An intensity I₄ of a negative first order diffraction on gratings of the third alignment segments 320 a-320 j and the first alignment segments 330 a-330 j is also detected. An intensity difference of I₃ and I₄ on gratings of the third alignment segments 320 a-320 j and the first alignment segments 330 a-330 j is calculated, wherein the Y-directional deviation (ΔY) is proportional to the intensity difference.

If gratings of the third alignment segments 320 a-320 j and the first alignment segments 330 a-330 j were on top of each other, forming one grating, the intensity I₃ of the positive first order diffraction and the intensity I₄ of the negative first order diffraction would be the same, then there would be no Y-directional deviation (ΔY) between the third alignment segments 320 a-320 j and the first alignment segments 330 a-330 j. If there is any misalignment between these two gratings, this will induce an asymmetry A′ (i.e. the intensity difference) between the intensities of I₃ and I₄, which is proportional to the Y-directional deviation (ΔY). This relationship could be expressed as one equation A′=I₃-I₄=K′*ΔY. In order to determine ΔY, the proportionality factor K′ needs to be determined first. To solve this problem, gratings are shifted with respect to each other by a distance d′. If there was no ΔY, there would be gratings with a relative shift +d′ yielding an asymmetry A₃=K′*d′ and gratings with a relative shift −d′ yielding an asymmetry A₄=−K′*d′. In the presence of ΔY, the relative shifts of gratings amount to ΔY+d′ and ΔY−d′, yielding asymmetries A₃=K′*(ΔY+d′) and A₄=K′*(ΔY−d′). With these two equations, one may find ΔY=d′*(A₃+A₄)/(A₃-A₄). So the Y-directional deviation (ΔY) is obtained. As depicted in step 414 in FIG. 11, the method 400 continues with step 414 by calculating a Y-directional offset value by the Y-directional deviation (ΔY). The Y-directional offset value is the reverse of the Y-directional deviation (ΔY), or any value appropriate for adjusting the Y-directional deviation (ΔY).

As depicted in step 416 in FIG. 11, the method 400 continues with step 416 by using the X-directional offset value and/or the Y-directional offset value to compensate for an overlay error. The overlay error may comprise the X-directional deviation (ΔX), the Y-directional deviation (ΔY), or the combination of both. After the overlay error is compensated, the multi-layer overlay alignment accuracy (AA) is adjusted and will be implemented in next run of the photolithography process. In some embodiments, the method 400 may further comprise repeating a photolithography process if the overlay error is larger than an acceptable deviation. If the overlay error is larger than an acceptable deviation, the alignment between the third feature 320 and the first feature 330, and/or the alignment between the third feature 320 and the second feature 340, do/does not reach the required accuracy. Consequently, the third feature 320 has to be removed, and the photolithography process has to be repeated until the overlay error is no larger than the acceptable deviation.

In various embodiments, the method 400 may be used with the overlay mark 305 of FIGS. 9, 10A, and 10B. As mentioned earlier, the detailed description of FIGS. 9, 10A, and 10B for the overlay mark 305 may refer to that of FIGS. 7, 8A, and 8B for the overlay mark 300. Thus, the method 400 used with overlay mark 305 may also refer to the method 400 used with overlay mark 300.

The overlay mark and method of the present disclosure are not limited to be used by a planar device on the substrate and can also be applied to a non-planar device such as a fin-like field effect transistor (FinFET). By using the overlay mark and method of the present disclosure, the accuracy of multi-layer overlay alignment is enhanced. Area cost required by the overlay mark of the present disclosure is lower than that of the prior approach since the features of different layers for checking alignment accuracy are positioned on the same area of the substrate. Also, time consumed by the method of the present disclosure is less than that of the prior approach because the method collects and analyzes the data which are really concerned. For example, the Y-directional deviation may be more concerned than the X-directional deviation for checking the alignment accuracy between the first layer and the third layer, while the X-directional deviation may be more concerned than the Y-directional deviation for checking the alignment accuracy between the second layer and the third layer. So, the method tends to focus on the X-directional deviation between the second layer and the third layer, and the Y-directional deviation between the first layer and the third layer. As a result, the area cost and the time consumption can be reduced by using the overlay mark and method of the present disclosure.

One of the broader forms of the present disclosure involves an overlay mark. The overlay mark comprises a first feature extending only along a first longitudinal direction; a second feature extending along a second longitudinal direction different from the first longitudinal direction; and a third feature extending along both the first longitudinal direction and the second longitudinal direction; wherein the first feature is in a first layer, the second feature is in a second layer over the first layer, and the third feature is in a third layer over the second layer.

In some embodiments, the first longitudinal direction is substantially perpendicular to the second longitudinal direction.

In some embodiments, the first feature comprises a plurality of alignment segments substantially parallel to each other.

In some embodiments, the second feature comprises a plurality of alignment segments substantially parallel to each other.

In some embodiments, the third feature comprises a plurality of alignment segments substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments substantially parallel to each other extending along the second longitudinal direction.

In some embodiments, the third feature comprises four alignment segments forming a rectangular pattern or a square pattern.

In some embodiments, the first feature comprises an isolation structure.

In some embodiments, the second feature comprises a gate electrode.

In some embodiments, the third feature comprises an opening in a mask.

Another of the broader forms of the present disclosure involves a device. The device comprises a substrate; and an overlay mark over the substrate, wherein the overlay mark comprises a first feature extending only along a first longitudinal direction; a second feature extending along a second longitudinal direction different from the first longitudinal direction; and a third feature extending along the first longitudinal direction and the second longitudinal direction; wherein the first feature is in a first layer, the second feature is in a second layer over the first layer, and the third feature is in a third layer over the second layer.

In some embodiments, the first longitudinal direction is substantially perpendicular to the second longitudinal direction.

In some embodiments, the first feature comprises a plurality of alignment segments substantially parallel to each other.

In some embodiments, the second feature comprises a plurality of alignment segments substantially parallel to each other.

In some embodiments, the third feature comprises a plurality of alignment segments substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments substantially parallel to each other extending along the second longitudinal direction.

Still another of the broader forms of the present disclosure involves a method of adjusting multi-layer overlay alignment. The method comprises providing a first feature in a first layer over a substrate, wherein the first feature comprises a plurality of first alignment segments substantially parallel to each other extending only along an X direction; providing a second feature in a second layer over the first layer, wherein the second feature comprises a plurality of second alignment segments substantially parallel to each other extending along a Y direction different from the X direction; providing a third feature in a third layer over the second layer, wherein the third feature comprises a plurality of third alignment segments substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments substantially parallel to each other extending along the Y direction; measuring an X-directional deviation between the fourth alignment segments and the second alignment segments; calculating an X-directional offset value by the X-directional deviation; measuring a Y-directional deviation between the third alignment segments and the first alignment segments; calculating a Y-directional offset value by the Y-directional deviation; and using the X-directional offset value or the Y-directional offset value to compensate for an overlay error.

In some embodiments, the step of measuring an X-directional deviation between the fourth alignment segments and the second alignment segments comprises defining a centerline X1 parallel to the fourth alignment segments; defining a centerline X2 parallel to the second alignment segments; and calculating the X-directional deviation between the centerline X1 and the centerline X2.

In some embodiments, the step of measuring a Y-directional deviation between the third alignment segments and the first alignment segments comprises defining a centerline Y1 parallel to the third alignment segments; defining a centerline Y2 parallel to the first alignment segments; and calculating the Y-directional deviation between the centerline Y1 and the centerline Y2.

In some embodiments, the step of measuring an X-directional deviation between the fourth alignment segments and the second alignment segments comprises detecting an intensity I₁ of a positive first order diffraction on gratings of the fourth alignment segments and the second alignment segments; detecting an intensity I₂ of a negative first order diffraction on gratings of the fourth alignment segments and the second alignment segments; and calculating an intensity difference of I₁ and I₂ on gratings of the fourth alignment segments and the second alignment segments, wherein the X-directional deviation is proportional to the intensity difference.

In some embodiments, the step of measuring a Y-directional deviation between the third alignment segments and the first alignment segments comprises detecting an intensity I₃ of a positive first order diffraction on gratings of the third alignment segments and the first alignment segments; detecting an intensity I₄ of a negative first order diffraction on gratings of the third alignment segments and the first alignment segments; and calculating an intensity difference of I₃ and I₄ on gratings of the third alignment segments and the first alignment segments, wherein the Y-directional deviation is proportional to the intensity difference.

In some embodiments, the method further comprises repeating a photolithography process if the overlay error is larger than an acceptable deviation.

The foregoing has outlined features of several embodiments so that those skilled in the art may better understand the aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they may make various changes, substitutions and alterations herein without departing from the spirit and scope of the present disclosure. 

What is claimed is:
 1. An overlay mark, comprising: a first feature extending only along a first longitudinal direction; a second feature extending along a second longitudinal direction different from the first longitudinal direction; and a third feature extending along the first longitudinal direction and the second longitudinal direction; wherein the first feature is in a first layer, the second feature is in a second layer over the first layer, and the third feature is in a third layer over the second layer.
 2. The overlay mark of claim 1, wherein the first longitudinal direction is substantially perpendicular to the second longitudinal direction.
 3. The overlay mark of claim 1, wherein the first feature comprises a plurality of alignment segments substantially parallel to each other.
 4. The overlay mark of claim 1, wherein the second feature comprises a plurality of alignment segments substantially parallel to each other.
 5. The overlay mark of claim 1, wherein the third feature comprises a plurality of alignment segments substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments substantially parallel to each other extending along the second longitudinal direction.
 6. The overlay mark of claim 1, wherein the third feature comprises four alignment segments forming a rectangular pattern or a square pattern.
 7. The overlay mark of claim 1, wherein the first feature comprises an isolation structure.
 8. The overlay mark of claim 1, wherein the second feature comprises a gate electrode.
 9. The overlay mark of claim 1, wherein the third feature comprises an opening in a mask.
 10. A device, comprising: a substrate; and an overlay mark over the substrate, wherein the overlay mark comprises: a first feature extending only along a first longitudinal direction; a second feature extending along a second longitudinal direction different from the first longitudinal direction; and a third feature extending along both the first longitudinal direction and the second longitudinal direction; wherein the first feature is in a first layer, the second feature is in a second layer over the first layer, and the third feature is in a third layer over the second layer.
 11. The device of claim 10, wherein the first longitudinal direction is substantially perpendicular to the second longitudinal direction.
 12. The device of claim 10, wherein the first feature comprises a plurality of alignment segments substantially parallel to each other.
 13. The device of claim 10, wherein the second feature comprises a plurality of alignment segments substantially parallel to each other.
 14. The device of claim 10, wherein the third feature comprises a plurality of alignment segments substantially parallel to each other extending along the first longitudinal direction and a plurality of alignment segments substantially parallel to each other extending along the second longitudinal direction.
 15. A method of adjusting multi-layer overlay alignment, comprising: providing a first feature in a first layer over a substrate, wherein the first feature comprises a plurality of first alignment segments substantially parallel to each other extending only along an X direction; providing a second feature in a second layer over the first layer, wherein the second feature comprises a plurality of second alignment segments substantially parallel to each other extending along a Y direction different from the X direction; providing a third feature in a third layer over the second layer, wherein the third feature comprises a plurality of third alignment segments substantially parallel to each other extending along the X direction and a plurality of fourth alignment segments substantially parallel to each other extending along the Y direction; measuring an X-directional deviation between the fourth alignment segments and the second alignment segments; calculating an X-directional offset value by the X-directional deviation; measuring a Y-directional deviation between the third alignment segments and the first alignment segments; calculating a Y-directional offset value by the Y-directional deviation; and using the X-directional offset value or the Y-directional offset value to compensate for an overlay error.
 16. The method of claim 15, wherein the step of measuring an X-directional deviation between the fourth alignment segments and the second alignment segments comprises: defining a centerline X1 parallel to the fourth alignment segments; defining a centerline X2 parallel to the second alignment segments; and calculating the X-directional deviation between the centerline X1 and the centerline X2.
 17. The method of claim 15, wherein the step of measuring a Y-directional deviation between the third alignment segments and the first alignment segments comprises: defining a centerline Y1 parallel to the third alignment segments; defining a centerline Y2 parallel to the first alignment segments; and calculating the Y-directional deviation between the centerline Y1 and the centerline Y2.
 18. The method of claim 15, wherein the step of measuring an X-directional deviation between the fourth alignment segments and the second alignment segments comprises: detecting an intensity I₁ of a positive first order diffraction on gratings of the fourth alignment segments and the second alignment segments; detecting an intensity I₂ of a negative first order diffraction on gratings of the fourth alignment segments and the second alignment segments; and calculating an intensity difference of I₁ and I₂ on gratings of the fourth alignment segments and the second alignment segments, wherein the X-directional deviation is proportional to the intensity difference.
 19. The method of claim 15, wherein the step of measuring a Y-directional deviation between the third alignment segments and the first alignment segments comprises: detecting an intensity I₃ of a positive first order diffraction on gratings of the third alignment segments and the first alignment segments; detecting an intensity I₄ of a negative first order diffraction on gratings of the third alignment segments and the first alignment segments; and calculating an intensity difference of I₃ and I₄ on gratings of the third alignment segments and the first alignment segments, wherein the Y-directional deviation is proportional to the intensity difference.
 20. The method of claim 15, further comprising repeating a photolithography process if the overlay error is larger than an acceptable deviation. 